Subwavelength ultrasonic measurement of a very thin fluid layer thickness in a trilayer
Identifieur interne : 001262 ( France/Analysis ); précédent : 001261; suivant : 001263Subwavelength ultrasonic measurement of a very thin fluid layer thickness in a trilayer
Auteurs : O. Lenoir [France] ; J-L. Izbicki [France] ; M. Rousseau [France] ; F. Coulouvrat [France]Source :
- Ultrasonics [ 0041-624X ] ; 1997.
Abstract
We suggest two original methods to determine the thickness of a fluid layer so thin that it cannot be evaluated by classical techniques. These methods are based upon the characteristic behavior of some structure resonances. We recall the main features of these particular resonances and we report the relations between the liquid layer thickness and the structure cut-off frequencies. Then, the experimental devices are presented which give these cut-off frequencies. The thickness, so obtained, is given with a good precision since the error is less than 5%.
Url:
DOI: 10.1016/S0041-624X(97)00069-3
Affiliations:
- France
- Haute-Normandie, Région Normandie, Île-de-France
- Le Havre, Paris
- Université Pierre-et-Marie-Curie, Université du Havre
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ISTEX:23690B8EA88265CEAF8A4A08694E9295287AF5A6Le document en format XML
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<front><div type="abstract" xml:lang="en">We suggest two original methods to determine the thickness of a fluid layer so thin that it cannot be evaluated by classical techniques. These methods are based upon the characteristic behavior of some structure resonances. We recall the main features of these particular resonances and we report the relations between the liquid layer thickness and the structure cut-off frequencies. Then, the experimental devices are presented which give these cut-off frequencies. The thickness, so obtained, is given with a good precision since the error is less than 5%.</div>
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